Automated magazine of up to seven 12-sample trays
Philips PW2404 Wavelength-Dispersive XRF Spectrometer
Python based software allowing remote access control from existing software / system using socket commands Collects a high resolution X-ray diffraction pattern from the single crystal out of which the right crystallographic plane cut can be selected with excellent accuracy Delivers an intense X-ray beam with less than 0.3mm on sample Allows real-time crystal orientation down to 0.1 degrees accuracy 3-Circle orientation of large or small samples Philips XPERT Powder Diffractometer, room 025īruker GADDS with Vantec500 Area Detector HyPix-6000HE area detector (hybrid photon counting) Rigaku XTALab Synergy-S Single Crystal Diffractometer *The billing rates are for the following systems and are subject to change. Our Rates X-Ray User TypeĬontact the department for availability and ratesĬontact the facility for availability and rates
The users of the x-ray facility (including trained students and technicians) are in complete compliance with radiation safety (NJ and Rutgers) and all applicable NJ state laws, and are trained on-site by the lab manager. Our ServicesĪnalyses include molecular and crystal structure determination (single-crystal or powder),finding lattice parameters, phase identification, percent crystallinity, crystal perfection (rocking curves), residual stress or texture analysis, orientation of crystallite planes and bulk crystal orientation for very large (1 – 30 mm) or very thin (<50 nm) single crystals. The physical forms of these materials include single- or poly- crystalline (powder) solids, liquid crystals, polymers (and bio-polymers), and deposits on substrates, mixtures and composites having good or poor crystallinity. The departmental x-ray diffraction facility at CCB is dedicated to the collection and analysis of high-quality x-ray diffraction data of materials of interest to the faculty and their collaborators.